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leejiacheng1

10-21-2020, 08:51 PM
https://www.udemy.com/course/vlsi-design-for-test-dft-jtag-boundary-scan-and-ijtag/

A detailed review of concepts described in IEEE 1149.1 and IEEE 1687-2014
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Rating: 3.6 out of 53.6
(6 ratings)
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2hr of on-demand video
Created by VLSI Foundation
Best Blackhat Forum > UDEMY Section > Udemy 100% FREE for LIMITED TIME > [F4LT] VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG
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