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10-21-2020, 08:51 PM
Post: #1
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[F4LT] VLSI - Design For Test (DFT)- JTAG, Boundary SCAN and IJTAG
https://www.udemy.com/course/vlsi-design-for-test-dft-jtag-boundary-scan-and-ijtag/
A detailed review of concepts described in IEEE 1149.1 and IEEE 1687-2014 New Rating: 3.6 out of 53.6 (6 ratings) 170 students 2hr of on-demand video Created by VLSI Foundation
Reps+ are always welcome!
Happy Learning! Jia Cheng bro. My other posts that you might miss: bestblackhatforum.com/search.php?action=finduser&uid=341124 |
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